Rigaku zero background sample holder
This X-ray fluorescence analysis system analyzes a sample using X-ray fluorescence generated as a result of the irradiation of primary X-rays onto the surface of the sample. Publication/Patent Number: WO2019244432A1Ībstract: Provided is an X-ray fluorescence analysis system that makes accurate measurement time calculation possible. The X-ray fluorescence spectrometer according to the present invention includes: an X-ray source (100) configured to irradiate a sample (103) with primary X-rays a spectroscopic device (120) configured to disperse secondary X-rays emitted from the sample (103) an energy-dispersive detector (110) configured to measure an intensity of the secondary X-rays a retracting mechanism (108) configured to retract the spectroscopic device (120) from a path of the secondary X-rays a scanning mechanism (114), which is configured to continuously move the detector (110) between an auxiliary measurement area (124) for measuring the secondary X-rays in a state where the spectroscopic device (120) is retracted and a main measurement area (122) for measuring the dispersed secondary X-rays a storage device (116) configured to store, in advance, a ratio between a background intensity measured in the auxiliary measurement area (124) and a background intensity measured in the main measurement area (122) and an arithmetic device (118) configured to perform correction and quantitative analysis, the correction including subtracting a value, which is obtained by multiplying the background intensity in the auxiliary measurement area (124) by the ratio, from a measured intensity in the main measurement area (122). Provided is an X-ray fluorescence spectrometer, which has a simple structure, and is capable of promptly performing high-accuracy analysis. Publication/Patent Number: US2019302041A1